Ieee ferlet-cavrois 2007 new insights
WebFig. 9. Re-constructed SETs from transient current measurements on single transistors (shown Fig. 8), by using the method of [10]. - "New Insights Into Single Event Transient … Web14 sep. 2007 · The SEE test bench used for our experiments has been validated with measurement of SEB and SEGR on MOSFETs. Published in: 2007 9th European Conference on Radiation and Its Effects on Components and Systems Article #: Date of Conference: 10-14 September 2007 Date Added to IEEE Xplore: 18 August 2009 ISBN …
Ieee ferlet-cavrois 2007 new insights
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Web12 jun. 2013 · V. Ferlet-Cavrois, L. Massengill, P. Gouker. Published 12 June 2013. Engineering. IEEE Transactions on Nuclear Science. The creation of soft errors due to … Web7. V. Ferlet-Cavrois "New insights into single event transient propagation in chains of inverters—evidence for propagation-induced pulse broadening" IEEE Trans. Nucl Sci. …
WebA not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity. This site is created, … Web12 jun. 2013 · This paper presents a review of digital single event transient research, including: a brief historical overview of the emergence of SET phenomena, a review of the present understanding of SET mechanisms, a review of the state-of-the-art in SET testing and modelling, a discussion of mitigation techniques, and a discussion of the impact of …
WebVeronique Ferlet Cavrois. Affiliation. ESA ESTEC, Noordwijk, Netherlands DAM, DIF, CEA, Arpajon, France. Publication Topics ... IEEE websites place cookies on your device to … WebSEGR characterization of power MOSFETs: A new insight on PIGST associated to a non-destructive charge collection measurement tool more by Veronique Ferlet-cavrois In this …
Web16 mei 2013 · Published in: IEEE Transactions on Electron Devices ( Volume: 60 , Issue: 6 , June 2013 ) Article #: Page (s): 2001 - 2007 Date of Publication: 16 May 2013 ISSN Information: Print ISSN: 0018-9383 Electronic ISSN: 1557-9646 INSPEC Accession Number: 13502181 DOI: 10.1109/TED.2013.2256426
WebNMOS transistors were irradiated using X-ray, Co-60 gamma, electron, and proton radiation sources. The charge yield was estimated for protons of different energies and electrons … restaurants in caldwell texasWebBased on the silicon-on-insulator (SOI) technology and radiation-hardened silicon gate (RSG) process, a radiation-hardened high-voltage lateral double-diffused MOSFET (LDMOS) device is presented in this paper. With the gate supply voltage of 30 V, the LDMOS device has a gate oxide thickness of 120 nm, and the RSG process is effective … restaurants in callington cornwallWeb[V. Ferlet-Cavrois . HDR05] Experiment. Simulation. Gate voltage (V) Drain current (A) Author: Veronique Ferlet-Cavrois Created Date: 04/17/2013 03:20:50 Title: Radiation testing of electronic components for space applications Last modified by: Veronique Ferlet-Cavrois Company: provide soft copyWeb6 apr. 2024 · In this study, a pretreatment method for improving the radiation resistance of Er-Yb co-doped silica fiber (EYDF) is proposed. EYDF is the object in this method and is processed by two steps, including deuterium loading and pre-irradiation. The effects of pretreatment conditions on the laser performance and radiation resistance of EYDF were … provides no steering controlWeb1 aug. 2012 · Authors: Veronique Ferlet-Cavrois James R. Schwank Sandra Liu Deakin University Michele Muschitiello European Space Agency Abstract and Figures The effects of heavy-ion test conditions and beam... provide somebody with something什么意思WebIn the last years the number of micro and nanosatellites, respectively microsat and nanosat, has rapidly increased.These satellites allow testing, experimenting and proving several new ideas by reducing at the same time the overall costs of the missions [1,2].The increase in the number of microsats and nanosats and the augmented resolution of modern sensors … provide some backgroundWebNeed Help? US & Canada: +1 800 678 4333 Worldwide: +1 732 981 0060 Contact & Support restaurants in callaway gardens